DC Characterisation of C60 Whiskers and Nanowhiskers

C60 whiskers exhibit increasing conductivity with decreasing diameter. At diameters of 1 μm and below, a single-crystal structure predominates, and enhanced electrical characteristics are expected; however, no supporting data exists in the literature. Here, results of four-point probe measurements on C60 whiskers and nanowhiskers with diameters in the range 650 nm to 1.3 μm are reported for the first time. Samples are attached to pre-patterned planar and raised electrodes using FIB-deposited tungsten. A low resistivity of 3 Ωcm is measured in air, on a C60 whisker having a diameter of 650 nm, indicating strong potential for use in organic electronic applications of the future. Repeated current cycling in air is observed to promote sample degradation, possibly due to progressive oxidation of the carbon structure. A micromachined four-point probe is also used to try to establish non-invasive electrical connections with samples. Preliminary results of such trials are presented, indicating it to be a feasible alternative to the use of deposited electrodes.